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    This study examines atomic system decay using intense infrared and extreme ultraviolet (XUV) pulses. It analyzes photoelectron momentum to understand ionization channels and retrieve XUV pulse parameters.

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    Area of Science:

    • Atomic physics
    • Quantum optics
    • Ultrafast science

    Background:

    • Atomic systems subjected to intense laser fields exhibit complex ionization dynamics.
    • Understanding electron emission is crucial for characterizing ultrashort laser pulses.

    Purpose of the Study:

    • To investigate laser-induced atomic decay within combined Keldysh and streaking ionization channels.
    • To analyze the applicability of the streak camera method for retrieving extreme ultraviolet (XUV) pulse parameters under different ionization regimes.

    Main Methods:

    • Theoretical modeling of atomic system decay under intense infrared and perturbative XUV fields.
    • Analysis of photoelectron momentum spectra considering Keldysh and streaking ionization pathways.
    • Numerical simulations to validate the retrieval of XUV pulse parameters.

    Main Results:

    • Two distinct regimes of ionization dynamics were identified based on the dominance of Keldysh or streaking channels.
    • The interference between ionization channels affects photoelectron momentum distributions.
    • Successful retrieval of XUV pulse parameters is demonstrated for both analyzed cases.

    Conclusions:

    • The streak camera method is a viable tool for characterizing XUV pulses, even when ionization dynamics are complex.
    • The interplay between different ionization mechanisms must be considered for accurate pulse reconstruction.
    • This work provides insights into ultrafast electron dynamics and laser pulse metrology.