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Updated: Jul 2, 2025
In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
Recent progress in application of surface X-ray scattering techniques to soft interfacial films
Takanori Takiue1, Makoto Aratono2
1Department of Chemistry, Faculty of Science, Kyushu University, Fukuoka 819-0395, Japan; Faculty of Arts and Science, Kyushu University, Fukuoka 819-0395, Japan.
Abstract:
X-ray reflection (XR) and surface grazing incidence X-ray diffraction GIXD) techniques have traditionally been used to evaluate the structure of soft interfacial films. In recent years, the use of synchrotron radiation and two-dimensional detectors has enabled high resolution and high speed measurements of interfacial films, which makes it possible to evaluate more detailed and complex interfacial film structures and adsorption dynamics. In this review, we will provide an overview of recent progress in structural characterization of simple oil/water interfaces, interfacial films of biologically relevant materials, oil/water interfaces for extraction of rare metal ions, and adsorption of nanoparticles. Examples of the application of time-resolved XR methods and surface sensitive techniques such as GISAXS and surface X-ray fluorescence analysis will also be presented.
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