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A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
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Open-source microscope add-on for structured illumination microscopy
Mélanie T M Hannebelle1,2,3, Esther Raeth1,2, Samuel M Leitao1
1School of Engineering, Swiss Federal Institute of Technology (EPFL), Lausanne, Switzerland.
Nature Communications
|February 20, 2024
Summary
Researchers can now access super-resolution microscopy with the openSIM add-on. This open-hardware system upgrades existing microscopes, making advanced imaging accessible for innovative research without needing new equipment.
Area of Science:
- Microscopy
- Optical Imaging
- Biotechnology
Background:
- Super-resolution microscopy offers advanced imaging capabilities but often requires specialized, expensive systems.
- Many research labs lack the resources to acquire or build dedicated super-resolution microscopes.
- This limits access to cutting-edge techniques for a significant portion of the scientific community.
Purpose of the Study:
- To introduce an accessible solution for super-resolution microscopy.
- To enable researchers without dedicated systems to perform advanced imaging.
- To facilitate innovative research by democratizing super-resolution technology.
Main Methods:
- Development of the openSIM, an open-hardware add-on module.
- Design and documentation for easy duplication of the openSIM system.
- Integration of the openSIM with existing optical microscopes to create Structured Illumination Microscopes (SIM).
Main Results:
- The openSIM successfully upgrades standard optical microscopes to perform super-resolution imaging.
- The open-hardware design allows for straightforward replication in other laboratories.
- This approach makes super-resolution microscopy more accessible and cost-effective.
Conclusions:
- The openSIM add-on significantly enhances the capabilities of existing laboratory equipment.
- This innovation democratizes super-resolution microscopy, empowering more researchers.
- Facilitates advanced scientific discovery by lowering the barrier to entry for super-resolution techniques.
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