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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
Ke Xu1, Houwen Leng1
1School of Electrical & Control Engineering, Shenyang Jianzhu University, Shenyang 110168, China.
This study introduces a new method to assess atomic force microscopy (AFM) tip wear. Optimizing scanning parameters like frequency and amplitude minimizes tip wear, ensuring high-quality AFM images.
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