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Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses
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Research on Classification Algorithm of Silicon Single-Crystal Growth Temperature Gradient Trend Based on Multi-Level
Yu-Yu Liu1,2, Ling-Xia Mu1,2, Peng-Ju Zhang1,2
1School of Automation and Information Engineering, Xi'an University of Technology, Xi'an 710048, China.
Sensors (Basel, Switzerland)
|February 24, 2024
Summary
Early identification of abnormal furnace conditions is vital for silicon single-crystal preparation. A new multi-level feature fusion algorithm accurately predicts temperature gradient trends, improving crystal quality and preventing production failures.
Area of Science:
- Materials Science and Engineering
- Semiconductor Manufacturing
- Artificial Intelligence in Industrial Processes
Background:
- Silicon single-crystal preparation requires precise control of furnace conditions for high-quality output.
- Abnormal thermal field conditions can lead to crystal defects or complete growth failure.
- Timely detection and adjustment of anomalies are critical for successful silicon crystal production.
Purpose of the Study:
- To develop an algorithm for early identification of abnormal conditions in silicon single-crystal growth.
- To accurately classify temperature gradient trends using multi-level feature fusion.
- To enhance the stability and quality of silicon single crystals in industrial production.
Main Methods:
- A silicon single-crystal growth temperature gradient trend classification algorithm based on multi-level feature fusion.
- Categorization of temperature gradient trends using expert knowledge and qualitative analysis.
- Fusion of original, shallow statistical, and deep learning features with mutual information-based weighting.
- Classification of trend changes using a Deep Belief Network (DBN) model.
Main Results:
- The proposed algorithm effectively predicts changing trends in thermal field temperature gradients.
- Demonstrated ability to capture process dynamics and classify trend changes accurately.
- Experimental validation confirms the algorithm's efficacy in identifying temperature gradient shifts.
Conclusions:
- The developed algorithm significantly improves the accuracy of fault trend prediction in silicon crystal preparation.
- Early detection of thermal field anomalies minimizes product quality issues and production interruptions.
- This approach supports the stable growth of high-quality silicon single crystals for industrial demands.
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