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Erratum: "Realization of a composite ferroelectric characterization test system using a modified constant current method and a modified virtual ground method" [Rev. Sci. Instrum. 95, 035111 (2024)].

The Review of scientific instruments·2024

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Measuring Magnetically-Tuned Ferroelectric Polarization in Liquid Crystals

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Published on: August 15, 2018

Realization of a composite ferroelectric characterization test system using a modified constant current method and a

Ding-Yeong Wang¹

¹Department of Electrical Engineering, Feng Chia University, Taichung 407802, Taiwan.

The Review of Scientific Instruments

|March 6, 2024

Summary

A novel composite ferroelectric test system combining modified constant current (CCM) and virtual ground (VGM) methods was developed. This system accurately characterizes ferroelectric materials and reveals a reversible imprint phenomenon crucial for material science.

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Area of Science:

Materials Science
Electrical Engineering
Solid State Physics

Background:

Ferroelectric materials are crucial for memory and sensor applications.
Accurate characterization of ferroelectric properties is essential for device optimization.
Existing characterization methods may have limitations in accuracy and scope.

Purpose of the Study:

To design and implement a versatile composite ferroelectric characterization test system.
To investigate the impact of parasitic capacitance on hysteresis curves.
To identify and understand ferroelectric imprint phenomena.

Main Methods:

Developed a composite system integrating modified constant current method (CCM) and virtual ground method (VGM).
Utilized a microcontroller for software-controlled switching between test modes.
Validated the system using Keysight B2912B, B1530A, and Radiant Premier II for cross-verification.

Main Results:

The composite system demonstrated good consistency with commercial instruments.
Parasitic capacitance was identified as a factor affecting hysteresis curve appearance.
Reproducible and recoverable ferroelectric imprint phenomena were observed and analyzed.

Conclusions:

The developed composite system provides reliable ferroelectric characterization.
The imprint phenomenon arises from differences in polarization states and is reversible.
Optimized voltage profiling can mitigate the imprint phenomenon in ferroelectric capacitors.