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Updated: Jul 1, 2025

Author Spotlight: Efficient Image Recognition Using Directional Gradient Histogram Technique and Support Vector Machines
Published on: January 5, 2024
Yuanyuan Li1, Liyuan Song2, Yin Cai2
1Shanghai University of Engineering Science, Songjiang, Shanghai, 201620, China. liyuanyuanedu@163.com.
This study introduces an enhanced YOLOv4 model for industrial defect detection, improving accuracy for small defects. The system achieves high mean average precision (mAP) and real-time processing speeds for defect classification and localization.
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