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Diagnostics of Internal Defects in Composite Overhead Insulators Using an Optic E-Field Sensor.

Damiano Fasani1, Luca Barbieri1, Andrea Villa1

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An optical E-field sensor effectively detects internal defects in composite insulators for high-voltage lines. The sensor identifies defects by analyzing electric field distortions, crucial for maintaining power line integrity.

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Area of Science:

  • Electrical Engineering
  • Materials Science
  • Power Systems

Background:

  • Composite insulators offer advantages over traditional designs for high-voltage overhead lines, particularly in polluted environments.
  • Live-line diagnostics for composite insulators are still developing, especially for internal defects with subtle external signs.
  • Thermal imaging for defect detection can be hindered by solar radiation interference.

Purpose of the Study:

  • To investigate the use of an optical E-field sensor for diagnosing internal defects in composite insulators.
  • To develop a method for identifying the nature of internal defects through E-field profile analysis.
  • To establish the sensitivity threshold of the optical E-field sensor for defect detection.

Main Methods:

  • Utilized an optical E-field sensor (200 mHz-50 MHz bandwidth, 100 V/m min. detectable E-field) for live-line diagnostics.
  • Performed finite element modeling to simulate E-field profiles with various defect geometries.
  • Compared experimental E-field measurements with simulated profiles to identify defect characteristics.

Main Results:

  • The optical E-field sensor successfully detected the presence of internal defects by observing distortions in the E-field profile compared to sound insulators.
  • Experimental E-field profiles correlated well with simulated profiles when assuming a conductive internal defect.
  • Defects with conductivity less than two orders of magnitude higher than the surrounding material were not detected.

Conclusions:

  • Optical E-field sensing is a viable method for detecting internal defects in composite insulators.
  • The conductivity of internal defects significantly influences their detectability.
  • Further research may be needed to enhance the detection of low-conductivity defects.