Features in Backgrounds of Microscopy Images Introduce Biases in Machine Learning Analyses

David N Greenblott1, Florian Johann2, Jared R Snell3

  • 1Department of Chemical and Biological Engineering, University of Colorado Boulder, Boulder, CO 80303, United States.

Insights

Convolutional neural networks (CNNs) for subvisible particle analysis showed higher accuracy with backgrounded membrane imaging (BMI) due to image artifacts. Attribution methods revealed flow imaging microscopy (FIM) models were more robust, relying on particle features, not background.

Area of Science:

  • Pharmaceutical Science
  • Analytical Chemistry
  • Biotechnology

Background:

  • Subvisible particles are critical in therapeutic protein formulations.
  • Flow imaging microscopy (FIM) and backgrounded membrane imaging (BMI) are key techniques for particle analysis.
  • Both FIM and BMI capture digital images of particles for characterization.

Purpose of the Study:

  • To compare the performance of convolutional neural networks (CNNs) for classifying subvisible particles using FIM and BMI data.
  • To investigate the influence of image background on CNN classification accuracy for both techniques.
  • To assess the robustness of CNN models trained on FIM versus BMI images.

Main Methods:

  • Convolutional neural networks (CNNs) were trained to classify particle images from FIM and BMI.
  • Attribution analyses were performed to understand feature importance in CNN predictions.
  • Image segmentation was used to reduce background influence on CNN performance.

Main Results:

  • CNNs trained on BMI initially showed higher accuracy than those trained on FIM.
  • Attribution analysis revealed BMI-CNNs relied on membrane background features, while FIM-CNNs focused on particle features.
  • Image segmentation decreased BMI-CNN accuracy significantly but minimally impacted FIM-CNN accuracy.

Conclusions:

  • The superior accuracy of BMI-trained CNNs was an artifact of background features, not particle characteristics.
  • Robustness checks using attribution methods are crucial for validating machine learning models in particle analysis.
  • Careful consideration of image acquisition techniques and potential artifacts is essential for reliable subvisible particle characterization.