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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Current fluctuations in a partially asymmetric simple exclusion process with a defect particle

Ivan Lobaskin1, Martin R Evans1, Kirone Mallick2

  • 1School of Physics and Astronomy, University of Edinburgh, Peter Guthrie Tait Road, Edinburgh EH9 3FD, United Kingdom.

Physical Review. E
|March 16, 2024
PubMed

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