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Updated: Jun 30, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Limitations and drawbacks of DQE estimation methods applied to electron detectors

Olivier Marcelot1, Cécile Marcelot2, Sébastien Rolando1

  • 1ISAE-SUPAERO, 10 avenue Edouard Belin, Toulouse 31055, France.

Microscopy (Oxford, England)
|March 18, 2024
PubMed

Keywords:
CMOSDQEelectronsimage sensorsimulationtransmission electron microscopy

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