Structures of Solids
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
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Updated: May 4, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Joe D Morrow1, Chinonso Ugwumadu2, David A Drabold2
1Inorganic Chemistry Laboratory, Department of Chemistry, University of Oxford, Oxford, OX1 3QR, United Kingdom.
Defects in amorphous silicon (a-Si) are key to its properties. This study uses advanced computation to classify these defects, revising the floating-bond model and revealing defect clustering behavior.
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Published on: September 28, 2016
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Published on: July 17, 2020
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