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Life truncated multiple dependent state plan for imprecise Weibull distributed data.

Gadde Srinivasa Rao1, Muhammad Aslam2, Peter Kirigiti Josephat1

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Summary
This summary is machine-generated.

This study introduces a new multiple dependent state (MDS) sampling technique for light-emitting diode (LED) luminous intensity measurements. The proposed method requires a smaller sample size compared to existing plans, improving efficiency in quality control.

Keywords:
Classical statisticsIndeterminacyLuminous intensities of diodesMultiple dependent stateSingle sampling plan

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Area of Science:

  • Optoelectronics and Semiconductor Devices
  • Statistical Quality Control
  • Reliability Engineering

Background:

  • Accurate measurement of light-emitting diode (LED) luminous intensity is crucial for quality control.
  • Existing sampling plans may not adequately address uncertainties in luminous intensity measurements.
  • The Weibull distribution is a common tool for reliability analysis and lifetime data.

Purpose of the Study:

  • To develop a novel multiple dependent state (MDS) sampling technique for LED luminous intensity under conditions of indeterminacy.
  • To compare the proposed sampling technique with existing indeterminate sampling plans and single sampling plans (SSP).
  • To demonstrate the practical application of the new technique using LED luminous intensity data.

Main Methods:

  • Utilizing time-truncated sampling schemes combined with the Weibull distribution.
  • Developing a new MDS sampling technique to handle indeterminate luminous intensity data.
  • Performing comparative analysis against established sampling methodologies.

Main Results:

  • The Average Sample Number (ASN) is significantly influenced by the indeterminacy parameter.
  • The proposed MDS sampling technique requires a smaller sample size compared to SSP and current MDS plans.
  • The technique is validated through a practical example involving LED luminous intensity calculations.

Conclusions:

  • The developed MDS sampling strategy offers improved efficiency by reducing the required sample size.
  • This technique provides a more effective approach for quality assessment of LEDs under uncertainty.
  • The findings highlight the importance of considering indeterminacy in sampling plan design for optoelectronic devices.