X-ray Crystallography
IR Spectrometers
X-ray Imaging
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 29, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Houxun Miao1, James C Williams2, Daniel Josell3
1General Optics, LLC, Zionsville, Indiana, USA.
A novel four-grating x-ray interferometer offers high sensitivity and large field of view for multi-contrast imaging. This advancement simplifies system design, making advanced x-ray imaging more accessible for various applications.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: