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Establishing a reference focal plane using convolutional neural networks and beads for brightfield imaging
Joe Chalfoun1, Steven P Lund2, Chenyi Ling2
1National Institute of Standards and Technology, Gaithersburg, MD, USA. joe.chalfoun@nist.gov.
Scientific Reports
|April 2, 2024
Summary
Accurate and repeatable microscopy measurements are challenging. This study introduces a novel method using control beads and a convolutional neural network (ResNet 18) to establish a reference effective focal plane (REFP), significantly improving measurement reliability across different microscopes.
Area of Science:
- Microscopy and Image Analysis
- Computational Biology
- Biomedical Engineering
Background:
- Microscopy measurements suffer from repeatability issues due to sample heterogeneity, stage positioning, and slide thickness.
- Existing methods for establishing focal planes lack generalizability across different instruments.
Purpose of the Study:
- To develop a generalizable and highly accurate method for defining a reference effective focal plane (REFP).
- To improve the repeatability of image analytics measurements in microscopy.
Main Methods:
- Refined REFP definition using cubic spline fitting and cross-experiment data sharing.
- Implemented a convolutional regression neural network (ResNet 18) trained on control bead images.
- Validated the method on two different optical systems.
Main Results:
- The ResNet 18 network predicts REFP location with high accuracy (within 7.5 µm uncertainty).
- The method demonstrates generalizability across multiple microscopes and experimental conditions.
- Achieved high accuracy using as few as 6 beads per image.
Conclusions:
- The proposed method enhances measurement repeatability and accuracy in microscopy.
- The use of control beads and deep learning offers a robust solution for focal plane determination.
- This approach is applicable to diverse optical systems, advancing quantitative microscopy.

