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High Speed Sub-GHz Spectrometer for Brillouin Scattering Analysis
Published on: December 22, 2015
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High-resolution Si3N4 spectrometer: architecture & virtual channel synthesis and experimental demonstration
Optics Express
|April 4, 2024
Summary
This study presents a novel on-chip spectrometer for precise optical performance monitoring of WDM signals. The device offers high-resolution spectral analysis across the C-band, crucial for network optimization.
Area of Science:
- Photonics and Optical Engineering
- Telecommunications
- Integrated Optics
Background:
- Accurate network telemetry is vital for optimizing resources in modern communication networks.
- Monitoring the spectral profile of Wavelength Division Multiplexing (WDM) signals in fixed- and flex-grid architectures across the C-band presents significant challenges.
Purpose of the Study:
- To describe a novel two-stage, on-chip spectrometer architecture for quantitative spectral measurement of WDM signals.
- To achieve high-resolution (∼1.4 GHz) spectral analysis across the entire C-band with a single dynamic control.
Main Methods:
- A two-stage spectrometer design integrating a tuneable ring resonator filter and an Arrayed Waveguide Grating (AWG) subsystem.
- Utilizing CMOS-compatible Silicon Nitride (Si3N4) for fabrication of key components.
- Employing a novel virtual channel synthesis algorithm for signal processing.
Main Results:
- Experimental demonstration of complete spectrometer operation over a portion of the C-band.
- The spectrometer achieves high resolution across the C-band with a single dynamic control.
- The novel algorithm enhances robustness by correcting for fabrication variations and relaxes AWG design constraints.
Conclusions:
- The developed on-chip spectrometer is a promising solution for reliable optical performance monitoring.
- The integrated design and novel algorithm offer a robust and efficient method for WDM signal spectral analysis.
- This technology enables improved resource optimization through accurate network telemetry.
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