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Updated: Jun 29, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in

Seiichiro Ii1

  • 1Research Center for Structural Materials, National Institute for Materials Science (NIMS), Tsukuba 305-0047, Japan.

Materials (Basel, Switzerland)
|April 9, 2024
PubMed

Keywords:
electron energy loss spectroscopyenergy dispersive X-ray spectroscopygrain boundaryinterphase boundarytransmission electron microscopy

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