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Yuichi Tanaka1, Hirofumi Sato1,2, Hiroshi Nakano3
1Department of Molecular Engineering, Graduate School of Engineering, Kyoto University, Kyoto 615-8510, Japan.
This study introduces a new computational method to measure the frequency-dependent dielectric constant of solutions, including at interfaces. The technique accurately captures bulk and interfacial properties, offering a practical alternative to existing methods.
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