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Generation and Storage of Random Voltage Values via Ring Oscillators Comprising Feedback Field-Effect Transistors.
Jaemin Son1, Juhee Jeon1, Kyoungah Cho1
1Department of Electrical Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 02841, Republic of Korea.
Nanomaterials (Basel, Switzerland)
|April 12, 2024
Summary
This study shows how a ring oscillator with feedback field-effect transistors (FBFETs) generates and stores random voltage values. This technology advances true random number generator capabilities.
Area of Science:
- Electronics
- Materials Science
- Computer Science
Background:
- Traditional random number generation methods face limitations in speed and physical implementation.
- Integrating memory and logic functions is crucial for efficient computing.
Purpose of the Study:
- To demonstrate a novel method for generating and storing random voltage values.
- To explore the application of feedback field-effect transistors (FBFETs) in physical functions.
Main Methods:
- Utilizing a ring oscillator circuit composed of FBFETs.
- Leveraging the logic-in-memory function of FBFETs to extract analog voltage outputs.
- Analyzing the probability distribution and storage stability of generated random variables.
Main Results:
- The ring oscillator produced uniform probability distributions for binary outputs (51.6% for logic 0, 48.4% for logic 1).
- Generated analog voltages, representing binary random variables, were stably stored for over 5000 seconds.
- Demonstrated the extraction of continuous output voltages from oscillatory cycles.
Conclusions:
- The FBFET-based ring oscillator effectively generates and stores random voltage values.
- This approach shows significant potential for applications in advanced physical functions.
- The technology is promising for developing next-generation true random number generators.
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