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This study introduces an AI malfunction detection module for low-power embedded systems. The novel approach significantly enhances fault tolerance and maintenance, achieving over 98% performance in real-world tests.

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Area of Science:

  • Computer Engineering
  • Embedded Systems
  • Artificial Intelligence

Background:

  • Low-power embedded systems are crucial for data collection and exchange, but face maintenance challenges due to fault prediction and monitoring limitations.
  • Existing resource management frameworks lack specific protocols for low-power embedded system failures.
  • Identifying failures and implementing customized reaction mechanisms remain complex.

Purpose of the Study:

  • To address the maintenance and fault detection gaps in low-power embedded systems.
  • To propose a trilateral framework including stakeholder guidance, automated control, and AI-driven malfunction detection.
  • To enhance the reliability and fault tolerance of these systems.

Main Methods:

  • Development of a trilateral framework with periodic stakeholder prescriptions and automated control mechanisms.
  • Implementation of a backup AI malfunction detection module.
  • Design and development of three novel autonomous embedded systems using ARM Cortex cores for evaluation.

Main Results:

  • The AI malfunction detection module demonstrated outstanding performance in real-life testing.
  • Evaluation metrics consistently exceeded 98% across the developed embedded systems.
  • The approach proved effective in enhancing fault tolerance and maintenance capabilities.

Conclusions:

  • The proposed AI malfunction detection module significantly improves the reliability of low-power embedded systems.
  • The trilateral framework offers a comprehensive solution for system maintenance and failure prevention.
  • The developed approach is highly effective and reliable for critical embedded applications.