Temperature imaging inside fluid devices using a ratiometric near infrared (NIR-II/III) fluorescent Y2O3: Nd3+, Yb3+,

Masakazu Umezawa1, Hikaru Haraguchi2, Gaku Sugawara2

  • 1Department of Materials Science and Technology, Faculty of Advanced Engineering, Tokyo University of Science, 6-3-1 Niijuku, Katsushika, Tokyo, 125-8585, Japan. masa-ume@rs.tus.ac.jp.