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Echelon grating refractive index sensor.

Haotian Zhang, Xiaoping Li, Yue Pan

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    Summary
    This summary is machine-generated.

    This study introduces an echelon grating refractive index sensor offering high resolution and sensitivity. The novel design achieves a low detection limit and broad dynamic range for accurate refractive index measurements.

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    Area of Science:

    • Optical sensing
    • Nanotechnology
    • Metrology

    Background:

    • Existing optical refractive index sensors often compromise between resonant-wavelength resolution (RWR) and refractive index sensitivity (RIS).
    • There is a need for sensors with both high RWR and high RIS for precise refractive index determination.

    Purpose of the Study:

    • To design and demonstrate a novel refractive index sensor utilizing an echelon grating.
    • To achieve high resonant-wavelength resolution (RWR) and high refractive index sensitivity (RIS) simultaneously.
    • To expand the dynamic range and lower the detection limit for refractive index measurements.

    Main Methods:

    • Design of a refractive index sensor based on an echelon grating.
    • Leveraging the principal fringe characteristics of the echelon grating for high RWR.
    • Utilizing wavefront splitting interference for high RIS and large free spectral range (FSR) for expanded dynamic range.

    Main Results:

    • Experimentally achieved RWR of 2 × 10-2 nm and RIS of 1.14 × 104 nm/RIU.
    • Demonstrated a large FSR of 130 nm, contributing to an expanded dynamic range of 1.14 × 10-2 RIU.
    • Achieved a low refractive index detection limit of 1.59 × 10-6 RIU.

    Conclusions:

    • The echelon grating refractive index sensor successfully combines high RWR and high RIS.
    • The sensor exhibits a low detection limit, low cost, high stability, and good robustness.
    • Potential for further improvements in RWR and RIS exists, enabling even lower detection limits.