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Metal-Semiconductor Junctions01:24

Metal-Semiconductor Junctions

347
The contact of metal and semiconductor can lead to the formation of a junction with either Schottky or Ohmic behavior.
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The...
347

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Tolerance Considerations for MHMIC Manufacturing Process at Millimeter-Wave Band.

Chaouki Hannachi1, Matthieu Egels1, Philippe Pannier1

  • 1Institut Matériaux Microélectronique Nanosciences de Provence (IM2NP), CNRS, UMR 7334, Aix-Marseille Université, 13000 Marseille, France.

Sensors (Basel, Switzerland)
|April 27, 2024
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Summary

Manufacturing variations in monolithic hybrid microwave integrated circuits (MHMIC) at 60 GHz were studied. The research quantifies acceptable dimensional variations for thin-film components and bonding ribbons to improve MHMIC fabrication accuracy.

Keywords:
MHMICsTRLaccuracyanalysisbondingcalibrationerrormanufacturingmillimeter-waveradial stubresistorsthin-layertolerancestransmission linesuncertainties

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Area of Science:

  • Electrical Engineering
  • Microwave Engineering
  • Materials Science

Background:

  • Monolithic Hybrid Microwave Integrated Circuits (MHMIC) are crucial for 60 GHz millimeter-wave applications.
  • Manufacturing process uncertainties can significantly impact MHMIC performance.
  • Understanding fabrication tolerances is key to achieving reliable circuit performance.

Purpose of the Study:

  • To investigate manufacturing uncertainties in MHMIC fabrication at 60 GHz.
  • To assess the impact of tolerances in thin-film components and bonding on circuit performance.
  • To establish relationships between manufacturing variations and circuit parameters for improved fabrication.

Main Methods:

  • Experimental quantification of manufacturing tolerances for key MHMIC components.
  • Analysis of implementation tolerances for gold microstrip transmission lines, titanium oxide resistors, radial stubs, and gold-bonding ribbons.
  • Prototyping and performance evaluation of MHMIC circuits to assess tolerance impacts.

Main Results:

  • Identified acceptable dimensional variations for critical MHMIC components to maintain reasonable performance.
  • Quantified the impact of manufacturing tolerances on MHMIC circuit parameters.
  • Demonstrated a correlation between fabrication variations and circuit performance metrics.

Conclusions:

  • Manufacturing tolerances for thin-film components and bonding significantly affect 60 GHz MHMIC performance.
  • Establishing relationships between tolerances and circuit parameters allows for enhanced accuracy and flexibility in MHMIC fabrication.
  • This study provides a framework for optimizing MHMIC manufacturing processes by managing dimensional variations.