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Surface-Enhanced Raman Spectroscopy and Artificial Neural Networks for Detection of MXene Flakes' Surface
Andrii Trelin1, Anastasiia Skvortsova1, Anastasia Olshtrem1
1Department of Solid State Engineering, University of Chemistry and Technology, Prague 16628, Czech Republic.
Summary
This study introduces a novel method combining surface-enhanced Raman spectroscopy (SERS) and artificial neural networks (ANN) to accurately determine MXene (Ti3C2Tx) surface chemistry. This SERS-ANN approach offers a faster, simpler alternative to traditional XPS for analyzing these 2D materials.
Area of Science:
- Materials Science
- Nanotechnology
- Surface Chemistry
Background:
- MXene flake properties are dictated by surface termination groups (e.g., =O, -OH, -F).
- The ratio of these terminations influences flake stability and catalytic activity.
- Traditional surface chemistry determination relies on X-ray photoelectron spectroscopy (XPS).
Purpose of the Study:
- To develop a precise and reliable alternative method for determining MXene (Ti3C2Tx) surface chemistry.
- To combine surface-enhanced Raman spectroscopy (SERS) with artificial neural networks (ANN) for this purpose.
- To create a universal technique independent of flake preparation and measurement variations.
Main Methods:
- Utilized surface-enhanced Raman spectroscopy (SERS) with resonant excitation wavelengths.
- Applied artificial neural networks (ANN) for spectral analysis.
- Independently prepared Ti3C2Tx flakes by three groups using different Raman spectrometers.
Main Results:
- Manual SERS spectral analysis failed to accurately determine surface termination.
- The combined SERS-ANN approach achieved high accuracy in determining surface termination.
- Method reliability was confirmed using independently prepared samples.
Conclusions:
- The SERS-ANN method provides accurate MXene surface chemistry determination.
- This technique is faster and simpler than XPS.
- The developed universal method is independent of flake stability and preparation/measurement conditions.
