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Batch Specular Plane Flatness Measurements Based on Phase Measuring Deflectometry.

Zhuotong Li1, Dongxue Wang1, Lei Liu1

  • 1State Key Laboratory of Precision Measuring Technology & Instruments, Laboratory of MicroNano Manufacturing Technology, Tianjin University, Tianjin 300072, China.

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Summary

This study presents a novel method for high-precision, rapid measurement of multiple surfaces, enhancing manufacturing efficiency. The technique ensures accurate 3D surface profiling for batches of specular surfaces.

Keywords:
batch specular plane flatnessdiscrete surface measurementphase measuring deflectometryrapid reconstruction

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Area of Science:

  • Metrology
  • Optical Measurement
  • Surface Metrology

Background:

  • Flatness is crucial in manufacturing, affecting product fit and performance.
  • Current measurement techniques lack a balance between precision and efficiency.
  • Advancing manufacturing demands more accurate and faster measurement solutions.

Purpose of the Study:

  • Introduce a novel approach for high-precision and rapid measurement of multiple surfaces.
  • Address the limitations of existing methods in balancing accuracy and efficiency.
  • Enable swift and synchronized batch measurements for specular surfaces.

Main Methods:

  • Enhanced Phase Measuring Deflectometry (PMD) technique.
  • Matching based on polar lines and normal vector constraints for discrete surfaces.
  • Plane pre-positioning method to improve binocular matching efficiency.

Main Results:

  • Achieved high-precision and rapid measurements for multiple surfaces.
  • Successfully performed swift and synchronized batch measurements of specular surfaces.
  • Obtained accurate three-dimensional surface profiles for each measured surface.

Conclusions:

  • The proposed method enables accurate batch measurement of specular planes.
  • The enhanced PMD approach overcomes limitations of traditional methods.
  • This technique supports the increasing demand for efficient and precise manufacturing measurements.