Dual-branch information extraction and local attention anchor-free network for defect detection

In the production process, the presence of surface defects seriously affects the quality of industrial products. Existing defect detectors are not suitable for surface with scattered distribution and complex texture of defects. In this study, a dual-branch information extraction and local attention anchor-free network for defect detection (DLA-FCOS), which is based on the fully convolutional one-stage network, is proposed to accurately locate and detect surface defects of industrial products. Firstly, a dual-branch feature extraction network (DFENeT) is proposed and used to improve the extraction ability of complex defects. Then, a local feature enhancement module is proposed, and a residual connection is established to enrich local semantic information. Meanwhile, the self-attention mechanism is introduced to form local attentional residual feature pyramid networks (LA-RFPN) to eliminate the influences of feature misalignments. The mean average accuracy (mAP) and frames per second (FPS) of the proposed DLA-FCOS on the cut layer of the tobacco packet defect dataset (CLTP-DD) are 96.8% and 20.7, respectively, which meets the requirements for accurate and real-time defect detection. Meanwhile, the average accuracy of the proposed DLA-FCOS on the NEU-DET and GC10-DET datasets is 78.4% and 67.7%, respectively. The results demonstrate that the DLA-FCOS has good feasibility and high generalization capability to perform defect detection tasks of industrial products.