Parametric Survival Analysis: Weibull and Exponential Methods
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Establishing a Competing Risk Regression Nomogram Model for Survival Data
Published on: October 23, 2020
Subhankar Dutta1, Hana N Alqifari2, Amani Almohaimeed2
1Division of Mathematics, School of Advanced Sciences, Vellore Institute of Technology, Chennai, India.
This study enhances reliability estimation for the logistic exponential distribution (LED) using improved adaptive type-II progressive censoring schemes (IAT-II PCS). Novel classical and Bayesian methods improve accuracy for lifetime data analysis.
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