Incineration-source fingerprints and emission spectrums of dioxins with diagnostic application
Yuxuan Ying1, Yunfeng Ma2, Xiaoxiao Wang1
1State Key Laboratory of Clean Energy Utilization, Institute of Thermal Power Engineering of Zhejiang University, Hangzhou 310027, China.
Abstract:
Despite increasing waste-to-energy (WtE) capacities, there remain deficiencies in comprehension of 136 kinds of tetra- through octa-chlorinated dibenzo-p-dioxin and dibenzofurans (136 PCDD/Fs) originating from incineration sources. Samples from twenty typical WtE plants, encompassing coal-fired power plants (CPP), grate incinerators (GI), fluidized bed incinerators (FBI), and rotary kilns (RK), yielded extensive PCDD/F datasets. Research was conducted on fingerprint mapping, formation pathways, emission profiles, and diagnostic analysis of PCDD/Fs in WtE plants. Fingerprints revealed a prevalence of TCDF, followed by PeCDF, while CPP and RK respectively generated more PCDD and HxCDD. De novo synthesis was the predominant formation pathway except one plant, where CP-route dominated. DD/DF chlorination also facilitated PCDD/F formation, showing general trends of FBI > GI > CPP > RK. The PCDD/F emission intensities emitted in air pollution control system inlet (APCSI) and outlet (APCSO) followed the statistical sequence of RK > FBI > GI > CPP, with the average I-TEQ concentrations in APCSO reaching 0.18, 0.08, 0.11, and 0.04 ng I-TEQ·Nm-3. Emission spectrum were accordingly formed. Four clusters were segmented for diagnosis analysis, where PCDD/Fs in GI and FBI were similar, grouped as a single cluster. PCDD/Fs in CPP and RK demonstrated distinctive features in TCDD, HxCDD, and HxCDF. The WtE plants exceeding the limit value tended to generate and retain fewer TCDD and TCDF yet had higher fractions of HxCDD and HxCDF. The failure of APCS coupled with the intrinsic source strength of PCDD/Fs directly led to exceedance, highlighting safe operational practices. This study motivated source tracing and precise evaluation of 136 PCDD/Fs based on the revealed fingerprint profiles for WtE processes.
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