FFF print defect characterization through in-situ electrical resistance monitoring

Heime Jonkers1, Alexander Dijkshoorn2, Stefano Stramigioli2

  • 1EEMCS, Robotics and Mechatronics, University of Twente, 7522NB, Enschede, The Netherlands. h.r.jonkers@utwente.nl.

Scientific Reports
|May 24, 2024
PubMed