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Extended-Aperture Shape Measurements Using Spatially Partially Coherent Illumination (ExASPICE)
Mostafa Agour1,2, Claas Falldorf1, Ralf B Bergmann1,3
1BIAS-Bremer Institut für angewandte Strahltechnik, 28359 Bremen, Germany.
Sensors (Basel, Switzerland)
|May 25, 2024
Summary
Shape measurements of micro-parts using SPICE profilometry are enhanced by using multiple LED illumination directions. This novel approach improves measurement accuracy by overcoming aperture limitations, offering a faster, more robust 3D imaging solution.
Area of Science:
- Optical Metrology
- 3D Imaging
- Micro-part Measurement
Background:
- SPICE profilometry uses LED illumination and speckle contrast for 3D shape measurement.
- Existing SPICE methods offer speed and robustness but are limited by small illumination apertures affecting axial resolution.
- Confocal and white light interferometry are alternatives but can be slower or less robust.
Purpose of the Study:
- To overcome the aperture angle limitation in SPICE profilometry.
- To improve the axial scan resolution and measurement accuracy of SPICE.
- To present a novel multi-directional LED illumination method for SPICE.
Main Methods:
- Illuminating the object from different directions using multiple independent LED sources.
- Utilizing an electrically tunable lens in a 4f-configuration for fast depth scanning.
- Evaluating speckle contrast for depth discrimination with spatially partially coherent illumination.
Main Results:
- Reduced the full width at half maximum of the contrast envelope by one-eighth.
- Achieved a twofold improvement in measurement accuracy compared to standard SPICE.
- Successfully demonstrated shape measurements of various metal objects.
Conclusions:
- The proposed multi-directional LED illumination effectively overcomes SPICE's aperture limitation.
- This method significantly enhances measurement accuracy and axial resolution in 3D profilometry.
- The technique offers a fast, eye-safe, and robust solution for micro-part 3D shape measurement.

