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Mustafa Kaan Çan1, Yusuf Ziya Ider2
1Department of Electrical and Electronics Engineering, Bilkent University, 06800 Ankara, Turkey.
This study introduces a new Magnetic Resonance Electrical Properties Tomography (MREPT) method to correct concave bias in conductivity imaging. The improved phase-based approach enhances image quality without significantly increasing scan time.
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