Bias correction for phase-based cr-MREPT using low resolution B1+ magnitude

Mustafa Kaan Çan1, Yusuf Ziya Ider2

  • 1Department of Electrical and Electronics Engineering, Bilkent University, 06800 Ankara, Turkey.

Summary

This study introduces a new Magnetic Resonance Electrical Properties Tomography (MREPT) method to correct concave bias in conductivity imaging. The improved phase-based approach enhances image quality without significantly increasing scan time.