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Irradiance uniformity reshaping method for solar simulators based on computer-generated spatial filter films.

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    A new spatial filtering scheme using inkjet-printed film patterns improves irradiance uniformity in photovoltaic testing. This method enhances accuracy for artificial lighting systems, achieving Class A standards.

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    Area of Science:

    • Photovoltaic device testing
    • Optical engineering
    • Material science

    Background:

    • Irradiance uniformity is crucial for accurate photovoltaic (PV) device performance evaluation.
    • Artificial lighting systems often exhibit inherent non-uniformity, impacting test reliability.
    • Existing methods for irradiance correction may be complex or limited in application.

    Purpose of the Study:

    • To propose and validate a novel spatial irradiance filter scheme for post-correcting non-uniform artificial lighting.
    • To leverage the relationship between inkjet concentration and film transparency for precise light filtering.
    • To achieve Class A irradiance uniformity as defined by the IEC 60904-9 standard.

    Main Methods:

    • Development of a spatial filtering scheme based on inkjet-printed flexible film patterns.
    • Establishment of a characteristic equation linking irradiance absorption to pattern grayscale values.
    • Generation of spatial filtering patterns using light intensity distribution, matrix operations, and bilinear interpolation.
    • Implementation of an STM32 microprocessor-based system for irradiance measurement and verification.

    Main Results:

    • The proposed scheme successfully corrected irradiance non-uniformity in single lamp, planar array, and curved surface array light sources.
    • Significant improvements in irradiance uniformity were observed: 15.5% for single lamp, 24.01% for planar array, and 13.11% for curved surface array.
    • All tested configurations achieved Class A irradiance uniformity according to the IEC 60904-9 standard post-correction.

    Conclusions:

    • The inkjet-printed spatial irradiance filter scheme offers an effective and adaptable solution for enhancing uniformity in PV testing environments.
    • The method demonstrates high performance across various lighting configurations, meeting stringent international standards.
    • This technique provides a practical approach to improve the accuracy and reliability of photovoltaic device characterization.