Single-exposure quantitative differential interference contrast microscopy using bandlimited image and its Fourier...

Area of Science:

• Optics and Photonics
• Microscopy
• Biophysics

Background:

• Phase microscopy offers unique and rapid convergence for phase retrieval.
• Bandlimited image and Fourier image simultaneous recording (BIFT) is an established method.
• Quantitative differential interference contrast (DIC) microscopy traditionally requires multiple exposures.

Purpose of the Study:

• To develop a single-exposure quantitative DIC microscopy technique.
• To improve phase sensitivity beyond the standard BIFT method.
• To enable real-time phase imaging of nanoscale structures.

Main Methods:

• Integration of BIFT method with DIC microscopy.
• Optimization of initial phase difference (bias) between sheared lights.
• Analysis of image and Fourier space contrasts and phase sensitivity via simulation and experiment.

Main Results:

• Demonstrated improved phase sensitivity by optimizing bias.
• Successfully recovered a 25 nm height sample from a single exposure.
• Showcased opposite trends in image and Fourier space contrasts with varying biases.

Conclusions:

• The developed single-exposure quantitative DIC microscopy is a promising technique.
• Optimized bias balances contrast for enhanced phase sensitivity.
• Enables efficient, real-time phase imaging with high resolution.