Mass measurement under medium vacuum in optically levitated nanoparticles based on Maxwell speed distribution law

Area of Science:

• Physics
• Optical Metrology
• Nanotechnology

Background:

• Optical levitation is crucial for micro-nano particle mass measurement.
• Existing methods require prior knowledge of particle properties like density and shape.
• Accurate mass determination is vital for nanoscale sensing and metrology.

Purpose of the Study:

• To develop a novel, non-destructive method for measuring the mass of levitated nanoscale particles.
• To overcome limitations of existing techniques that require external driving forces or prior particle information.
• To achieve high-accuracy mass measurements in medium vacuum conditions.

Main Methods:

• Utilizing optical levitation to trap nanoscale particles.
• Fitting particle motion data to the Maxwell speed distribution law.
• Iterative refinement of measurements to reduce uncertainty.

Main Results:

• A new mass measurement method for levitated particles was proposed.
• Accuracy better than 7% was achieved at 10 mbar.
• The method demonstrated non-destructive testing capabilities without needing particle density or precise natural frequency.

Conclusions:

• The proposed method offers a new pathway for non-destructive nanoscale particle mass measurement.
• It provides a novel approach for sensing and metrology applications in levitation dynamics.
• The technique is suitable for measurements within the medium vacuum range.