Systematic inquiry in tests of negative/positive replica combinations for SEM
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Abstract:
High resolution replica materials are routinely used in scanning electron microscopy. A systematic evaluating procedure for replica combinations is proposed which details fourteen points to be recorded. These points include quantitative and qualitative information useful when assessing a replica combination for a particular research problem. A case study employing one silicone-based impression material and one epoxy resin is performed as an example of the procedure.
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