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Updated: Jun 28, 2026

SIVQ-LCM Protocol for the ArcturusXT Instrument
Published on: July 23, 2014
Xueqin Zhang1, Chang Liu2, Huitong Zhu2
1College of Information Science and Engineering, East China University of Science and Technology, Shanghai, 200237, China; Shanghai Key Laboratory of Computer Software Evaluating and Testing, Shanghai 201112, China.
This study introduces a weakly supervised framework for whole slide image analysis using Multiple Instance Learning (MIL). The method enhances classification accuracy and lesion detection without requiring detailed patch-level annotations.
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