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Updated: Jun 23, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Arindam Majhi1, Riley Shurvinton1, Paresh Chandra Pradhan1
1Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE, United Kingdom.
Advancements in ion beam figuring (IBF) achieve high-accuracy X-ray mirror correction. This technique demonstrates optical quality comparable to top-tier commercial optics for demanding scientific applications.
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