Jove
Visualize
Contact Us

Related Concept Videos

Metal-Semiconductor Junctions01:24

Metal-Semiconductor Junctions

333
The contact of metal and semiconductor can lead to the formation of a junction with either Schottky or Ohmic behavior.
Schottky Barriers
Schottky barriers arise when a metal with a work function (Φm) contacts a semiconductor with a different work function (Φs). Initially, electrons transfer until the Fermi levels of the metal and semiconductor align at equilibrium. For instance, if Φm > Φs, the semiconductor Fermi level is higher than the metal's before contact. The...
333

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

TOPS-CRISPR: Thermally-regulated and oligonucleotide-mediated one-pot CRISPR-Cas12a assay for ultra-sensitive and rapid on-site diagnostics.

Biosensors & bioelectronics·2026
Same author

Matrix metalloproteinase-12 in arterial diseases: context-dependent mechanisms of vascular remodeling and therapeutic implications.

Frontiers in cardiovascular medicine·2026
Same author

Feature Selection and Machine Learning Strategies for CT Radiomics-Based Survival Prediction in Non-Small Cell Lung Cancer: A Comparative Study.

Diagnostics (Basel, Switzerland)·2026
Same author

Expert consensus on surgical management of unilateral Wilms tumor (2025).

World journal of pediatric surgery·2026
Same author

Modulation of Exciton Transport in Few-Layer and Bulk Tungsten Disulfide under Hydrostatic Pressure.

Langmuir : the ACS journal of surfaces and colloids·2026
Same author

Development of an Interpretable Machine Learning Model for Predicting Clavien-Dindo Grade ≥2 Complications after Unilateral Minimally Invasive Pyeloplasty in UPJO: A Retrospective Cohort Study.

Journal of endourology·2026
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Jun 23, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

12.3K

Enhance Carrier Diffusion of Monolayer MoSe2 by Interface Engineering.

Kun Zhao1, Dawei He1, Xiaojing Liu1

  • 1Key Laboratory of Luminescence and Optical Information, Ministry of Education, Institute of Optoelectronic Technology, Beijing Jiaotong University, Beijing 100044, China.

ACS Applied Materials & Interfaces
|June 24, 2024
PubMed
Summary

Interface engineering significantly enhances the performance of two-dimensional materials like monolayer molybdenum diselenide (ML MoSe2) field-effect transistors (FETs). Modifying the interface with self-assembled monolayers improves carrier mobility for advanced electronics.

Keywords:
interface engineeringmobilitymonolayer MoSe2pump−probe techniqueself-assembled monolayer

More Related Videos

Preparation of Large-area Vertical 2D Crystal Hetero-structures Through the Sulfurization of Transition Metal Films for Device Fabrication
08:50

Preparation of Large-area Vertical 2D Crystal Hetero-structures Through the Sulfurization of Transition Metal Films for Device Fabrication

Published on: November 28, 2017

9.2K
A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
07:12

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Published on: August 28, 2018

9.6K

Related Experiment Videos

Last Updated: Jun 23, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

12.3K
Preparation of Large-area Vertical 2D Crystal Hetero-structures Through the Sulfurization of Transition Metal Films for Device Fabrication
08:50

Preparation of Large-area Vertical 2D Crystal Hetero-structures Through the Sulfurization of Transition Metal Films for Device Fabrication

Published on: November 28, 2017

9.2K
A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics
07:12

A Standard and Reliable Method to Fabricate Two-Dimensional Nanoelectronics

Published on: August 28, 2018

9.6K

Area of Science:

  • Materials Science
  • Condensed Matter Physics
  • Nanotechnology

Background:

  • Two-dimensional (2D) materials offer promising potential for next-generation electronics beyond complementary metal-oxide-semiconductor (CMOS) technology.
  • Field-effect transistors (FETs) based on 2D materials are of significant interest, but their performance is often limited by interface quality and extrinsic scattering.
  • Improving device performance necessitates addressing challenges related to charged impurities, charge traps, and substrate surface roughness at the material interface.

Purpose of the Study:

  • To investigate the impact of interface quality on carrier diffusion behavior in monolayer molybdenum diselenide (ML MoSe2).
  • To explore interface engineering strategies for enhancing the performance of ML MoSe2-based field-effect transistors (FETs).
  • To provide a feasible method for improving carrier diffusion and enabling the use of 2D materials in integrated circuits.

Main Methods:

  • Utilized an in situ ultrafast laser technique to study carrier diffusion behaviors in ML MoSe2, minimizing surface contamination during fabrication.
  • Employed interface engineering by introducing two types of self-assembled monolayers (SAMs) to modify the gate dielectric surface.
  • Achieved chemically stable interfaces through SAM modification for enhanced device performance.

Main Results:

  • Interface engineering with SAMs significantly enhanced the transport properties of ML MoSe2.
  • Carrier mobility in ML MoSe2 improved from approximately 59.4 cm² V⁻¹ s⁻¹ to 166.5 cm² V⁻¹ s⁻¹ after SAM modification.
  • Photocarrier dynamics of ML MoSe2 were carefully studied before and after interfacial engineering.

Conclusions:

  • Interface engineering is a crucial factor in optimizing the performance of 2D material-based electronic devices.
  • The developed SAM modification approach offers a viable method for improving carrier diffusion and transport properties in ML MoSe2.
  • This study paves the way for the practical application of 2D materials in future integrated circuits.