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Double resonance techniques in Nuclear Magnetic Resonance (NMR) spectroscopy involve the simultaneous application of two different frequencies or radiofrequency pulses to manipulate and observe two distinct nuclear spins. One important application of double resonance is spin decoupling, which selectively suppresses coupling with one type of nucleus while observing the NMR signal from another nucleus, simplifying the spectrum and enhancing resolution.
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Compensating Image Distortions in a Commercial Reflectron-Type Atom Probe.

Martina Heller1,2, Benedict Ott1, Peter Felfer1

  • 1Department of Materials Science, Institute for General Materials Properties, Friedrich-Alexander Universität Erlangen-Nürnberg (FAU), Martensstr.5, Erlangen 91058, Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
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PubMed
Summary
This summary is machine-generated.

This study presents a method for users to determine the imaging properties of reflectron atom probe instruments, improving 3D reconstruction accuracy. This enables precise material analysis by transforming detector data for better spatial resolution.

Keywords:
APT data correctionatom probereflectron

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Accurate 3D reconstruction in atom probe tomography (APT) is crucial for spatial resolution and data integrity.
  • Reflectron-based APT instruments offer enhanced mass resolving power but require accurate modeling of reflectron imaging properties.
  • Proprietary instrument designs often make these imaging properties inaccessible to users, hindering precise reconstruction.

Purpose of the Study:

  • To develop a user-accessible method for determining the imaging properties of reflectron systems in APT.
  • To provide a transformation function for converting detector data to a virtual detector plane, simplifying 3D reconstruction.
  • To enhance the accuracy and reliability of 3D reconstructions in commercial wide-angle reflectron APT instruments.

Main Methods:

  • Developed a practical method for characterizing reflectron imaging properties directly on commercial APT instruments.
  • Implemented a transformation function to map detector data to a virtual detector positioned before the reflectron.
  • Provided correction algorithms and reference data for CAMECA LEAP series instruments (3000, 4000, 5000, 6000).

Main Results:

  • Successfully determined the imaging properties of reflectrons for user-based analysis.
  • Established a reliable method for transforming detector data, enabling consistent 3D reconstructions.
  • Demonstrated the applicability of the method across multiple CAMECA LEAP instrument models.

Conclusions:

  • The developed method empowers users to accurately model reflectron imaging properties, overcoming manufacturer-specific limitations.
  • This facilitates improved 3D reconstruction accuracy and data interpretation in reflectron APT.
  • The provided algorithms and data enhance the utility and accessibility of advanced APT techniques for materials analysis.