Compensating Image Distortions in a Commercial Reflectron-Type Atom Probe

Area of Science:

• Materials Science
• Analytical Chemistry
• Physics

Background:

• Accurate 3D reconstruction in atom probe tomography (APT) is crucial for spatial resolution and data integrity.
• Reflectron-based APT instruments offer enhanced mass resolving power but require accurate modeling of reflectron imaging properties.
• Proprietary instrument designs often make these imaging properties inaccessible to users, hindering precise reconstruction.

Purpose of the Study:

• To develop a user-accessible method for determining the imaging properties of reflectron systems in APT.
• To provide a transformation function for converting detector data to a virtual detector plane, simplifying 3D reconstruction.
• To enhance the accuracy and reliability of 3D reconstructions in commercial wide-angle reflectron APT instruments.

Main Methods:

• Developed a practical method for characterizing reflectron imaging properties directly on commercial APT instruments.
• Implemented a transformation function to map detector data to a virtual detector positioned before the reflectron.
• Provided correction algorithms and reference data for CAMECA LEAP series instruments (3000, 4000, 5000, 6000).

Main Results:

• Successfully determined the imaging properties of reflectrons for user-based analysis.
• Established a reliable method for transforming detector data, enabling consistent 3D reconstructions.
• Demonstrated the applicability of the method across multiple CAMECA LEAP instrument models.

Conclusions:

• The developed method empowers users to accurately model reflectron imaging properties, overcoming manufacturer-specific limitations.
• This facilitates improved 3D reconstruction accuracy and data interpretation in reflectron APT.
• The provided algorithms and data enhance the utility and accessibility of advanced APT techniques for materials analysis.