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Updated: Jul 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
A meta-analysis of semiconductor materials fabricated in microgravity
Ashley R Wilkinson1, Frances Brewer1, Hannah Wright1
1Department of Chemistry and Biochemistry, Butler University, Indianapolis, IN, USA.
Abstract:
This meta-analysis of 160 semiconductor crystals that were grown in microgravity on orbital vehicles between 1973 and 2016 is based on publicly available information documented in the literature. This analysis provides comparisons of crystal metrics including size, structure quality, uniformity, and improved performance between crystals grown in microgravity or terrestrially. Improvement in at least one of these metrics was observed for 86% of those materials that included data in their studies.

