Side-view optical microscopy-assisted atomic force microscopy for thickness-dependent nanobiomechanics.

Area of Science:

• Biomaterials Science
• Nanotechnology
• Biophysics

Background:

• Accurate characterization of biomaterial mechanical properties is vital for understanding biological processes.
• Atomic force microscopy (AFM) is a key tool for nanomechanical analysis, but thickness measurement during experiments is challenging.
• Understanding thickness-dependent nanomechanics is crucial for advancing mechanobiology.

Purpose of the Study:

• To develop and validate a novel side-view optical microscopy-assisted AFM system.
• To enable real-time visualization of AFM indentation processes from the side.
• To precisely measure thickness-dependent nanomechanical properties of various biomaterials.

Main Methods:

• Integration of AFM with a detachable side-view optical microscopy module.
• Real-time imaging of AFM indentation from a side-view perspective.
• Application of the integrated system to microfabricated structures, hydrogels, living cells, and cell spheroids.

Main Results:

• The side-view optical microscopy-assisted AFM system successfully imaged indentation processes in real time.
• Experimental results confirmed that micro/nanoscale mechanical properties are closely related to specimen thickness.
• The system demonstrated effectiveness across diverse biomaterial systems.

Conclusions:

• Side-view optical microscopy-assisted AFM is a promising approach for accurate nanomechanics of biomaterial systems.
• This technique enhances AFM-based force spectroscopy for studying thickness-dependent properties.
• The findings will advance mechanobiology by enabling more precise analysis of biomaterial behavior.