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Total third-degree variation for noise reduction in atomic-resolution STEM images.

Kazuaki Kawahara1, Ryo Ishikawa1, Shun Sasano1

  • 1Institute of Engineering Innovation, The University of Tokyo, 2-11-16 Yayoi, Bunkyo, Tokyo 113-8656, Japan.

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Summary

This study introduces a new denoising method for Scanning Transmission Electron Microscopy (STEM) images. The novel approach enhances atomic resolution imaging of beam-sensitive materials like battery components.

Keywords:
atomic-resolution STEMdenoisingtotal third-degree variation regularization

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Area of Science:

  • Materials Science
  • Microscopy
  • Image Processing

Background:

  • Scanning Transmission Electron Microscopy (STEM) is crucial for atomic-level material analysis.
  • Electron beam irradiation can damage beam-sensitive materials, necessitating low-dose imaging.
  • Existing noise removal methods like Total Square Variation (TSV) can cause image blurring and intensity loss.

Purpose of the Study:

  • To develop an improved noise reduction technique for atomic-resolution STEM imaging.
  • To overcome the limitations of TSV regularization in preserving image quality for beam-sensitive materials.

Main Methods:

  • Proposed a novel denoising approach using L2 norm regularization based on higher-order total variation.
  • Utilized Total Third-Degree Variation (TTDV) as a regularization term, suitable for quadratic function approximations of STEM images.
  • Applied the TTDV method to denoise atomic-resolution STEM images of CaF2.

Main Results:

  • Successfully removed noise from atomic-resolution STEM images.
  • Preserved image quality without significant blurring or intensity reduction.
  • Clearly visualized Ca and F atomic columns in CaF2.

Conclusions:

  • The proposed TTDV-based denoising method effectively enhances atomic-resolution STEM imaging of electron-beam-sensitive materials.
  • This technique allows for precise structural analysis without compromising image quality.
  • Offers a valuable tool for studying materials like battery components at the atomic scale.