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Characterization of bubbler performance for low-volatility liquid precursor delivery
James E Maslar1, William A Kimes1, Brent A Sperling1
1Material Measurement Laboratory, National Institute of Standards and Technology 100 Bureau Drive, Gaithersburg, MD 20899, USA.
This study characterizes a bubbler for delivering cobalt precursors (CCTBA) in vapor deposition. A model accurately predicts precursor flow rates, crucial for optimizing chemical vapor deposition and atomic layer deposition processes.
Area of Science:
- Materials Science
- Chemical Engineering
- Semiconductor Manufacturing
Background:
- Low-volatility liquid precursors are essential for advanced deposition techniques.
- Accurate delivery of these precursors is critical for process control and film quality.
- Cobalt precursors like CCTBA are used in specialized semiconductor applications.
Purpose of the Study:
- To characterize the performance of a bubbler system for delivering cobalt precursor (CCTBA).
- To investigate the influence of process parameters (carrier gas flow rate, system pressure, bubbler temperature) on precursor delivery.
- To develop and validate a model for predicting precursor flow rates.
Main Methods:
- Experimental characterization of bubbler performance across a wide process window.
- Measurement of CCTBA partial pressure using a custom non-dispersive infrared gas analyzer.
- Development of a predictive model incorporating headspace partial pressure and pressure drop.
Main Results:
- CCTBA flow rates were accurately measured and modeled under various conditions.
- A model assuming constant partial pressure and including pressure drop showed good agreement with experimental data.
- The temperature dependence of CCTBA partial pressure was successfully parameterized using the August equation.
Conclusions:
- The bubbler system demonstrates reliable performance for delivering CCTBA.
- The developed model provides a deeper understanding of factors influencing bubbler performance.
- The findings are applicable to other low-volatility liquid precursors in vapor deposition processes.
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