Related Experiment Video
Updated: Jun 21, 2025

Quantifying X-Ray Fluorescence Data Using MAPS
Published on: February 17, 2018
Portable X-ray fluorescence spectrometry: a cost-effective method for analysing trace metals in deposited dust
Carlos Ibañez-Del Rivero1, Cassandra A Wheeler1, Kara L Fry1,2
1School of Natural Sciences, Faculty of Science and Engineering, Macquarie University, Sydney, New South Wales, 2109, Australia. mark.taylor@mq.edu.au.
Abstract:
For projects requiring extensive environmental sampling and rapid decision-making to identify trace metal contamination using dust wipes, the cost and time required for wet chemistry analysis can be prohibitive. Under such circumstances there is a need for a suitable screening method that is cost-effective, efficient, and portable. To address this need, this study investigated the utility of portable X-ray fluorescence (pXRF) for the analysis of trace metals in dust wipes. Here, 316 dust wipe samples from three different geographical settings co-located with mining and smelting operations were investigated for their trace metal loadings (μg m-2) of arsenic (As), chromium (Cr), copper (Cu), iron (Fe), manganese (Mn), nickel (Ni), lead (Pb), and zinc (Zn) using pXRF. Results collected using pXRF were compared against inductively coupled plasma mass spectrometry (ICP-MS) concentrations using matched dust wipes (n = 87) to assess reproducibility. A subset of dust wipes (n = 4) were subject to different pXRF analytical scenarios (ranging from 1 to 12 pXRF measurements) using a standardised test duration of 30 seconds to identify the most efficient number of tests for analytical precision. Conducting four pXRF tests on a single wipe (total exposure time of 120 seconds) returned comparable results to ICP-MS and was adopted for analysis of all samples. Results from dust wipes analysed with both ICP-MS and pXRF (n = 87) showed moderate to strong Spearman Rho correlations (rs = 0.489-0.956, p < 0.01) and linear regression coefficients of variation demonstrated good agreement between methods (R2 = 0.432-0.989, p < 0.05). Linear regression equations were used to correct pXRF data to the ICP-MS dust wipe data for samples analysed by both approaches, and applied to pXRF data that were not subject to ICP-MS analysis (n = 229). Application of the correction formula resulted in a substantial improvement of pXRF's accuracy and precision, confirming its effectiveness for assessing trace metals in dust wipes.
Related Concept Videos
Atomic Emission Spectroscopy: Overview
Atomic Emission Spectroscopy: Lab
Atomic Absorption Spectroscopy: Lab
Solutions containing organic solvents, such as low-molecular-mass alcohols, esters, or ketones, enhance absorbances by increasing...
Gas Chromatography: Types of Detectors-II
Atomic Fluorescence Spectroscopy
Atomic Emission Spectroscopy: Instrumentation

