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Related Concept Videos

X-ray Imaging01:24

X-ray Imaging

German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with X-rays, and by 1900, X-ray was widely...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...

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Fabrication of Uniform Nanoscale Cavities via Silicon Direct Wafer Bonding
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Double-Sided Bonding Process Enables X-ray Flat Panel Detectors.

Hui Zhang1,2, Shujie Tie3, Jiajiu Ye1

  • 1Institute of Solid-State Physics, Hefei Institutes of Physical Science, Chinese Academy of Science, Hefei 230031, China.

ACS Applied Materials & Interfaces
|July 12, 2024
PubMed
Summary
This summary is machine-generated.

Metal halide perovskites offer advanced X-ray detection capabilities. A new double-sided bonding method enables large-area perovskite X-ray detector fabrication, overcoming integration challenges.

Keywords:
X-ray detectorsdouble-sided bonding (DSB)large-size waferultralow detection limitδ-CsPbI3

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Area of Science:

  • Materials Science
  • Detector Physics
  • Solid-State Electronics

Background:

  • Metal halide perovskites exhibit promising photoelectric properties for X-ray detection.
  • Current challenges include integrating perovskites into large-area pixelated sensors for direct X-ray imaging.

Purpose of the Study:

  • To develop a scalable fabrication strategy for large-area perovskite X-ray detector arrays.
  • To demonstrate the performance of delta-Cesium Lead Iodide (δ-CsPbI3) in direct X-ray detection.

Main Methods:

  • A double-sided bonding process utilizing van der Waals force was employed.
  • A wet film deposition technique bonded a thin-film transistor substrate to a δ-CsPbI3 wafer.
  • Characterization of the freestanding polycrystalline δ-CsPbI3 wafer's X-ray detection performance.

Main Results:

  • The fabricated device facilitates area-array imaging for X-ray detection.
  • The δ-CsPbI3 wafer achieved an ultralow detection limit of 3.46 nGyair s-1 under 50 kVP X-ray irradiation.
  • Stable signal output was maintained with a signal current drift of 3.5 × 10-5 pA cm-1 s-1 V-1 under 234.9 mGyair accumulated dose.

Conclusions:

  • The proposed double-sided bonding strategy enables the fabrication of large-area perovskite X-ray detector arrays.
  • This method offers a novel approach for the industrial production of perovskite-based X-ray flat panel detectors.
  • δ-CsPbI3 demonstrates excellent stability and sensitivity, paving the way for next-generation X-ray imaging.