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Visualization system to identify structurally vulnerable links in OHT railway network in semiconductor FAB using
Jinwoo Choi1, Youngbin Park2, Yeeun Choi1
1Graduated School of Data Science, Seoul National University, Seoul, South Korea.
This study identifies critical links in semiconductor factory transport networks using a novel centrality algorithm. A visualization system helps pinpoint vulnerabilities to improve production efficiency.
Area of Science:
- Industrial Engineering
- Computer Science
- Operations Research
Background:
- Semiconductor fabrication relies on automated guided vehicles (AGVs) like Overhead Hoist Transports (OHTs) for wafer transport.
- Existing routing algorithms (e.g., Dijkstra's) can cause congestion and deadlocks in complex OHT networks.
- Identifying structurally vulnerable links is crucial for optimizing FAB productivity.
Purpose of the Study:
- To identify structurally vulnerable links in Overhead Hoist Transport (OHT) railway networks within semiconductor fabrication (FAB).
- To develop a modified betweenness centrality algorithm accounting for the hierarchical node-port structure of OHT networks.
- To create a web-based visualization system for enhanced on-site decision-making regarding network vulnerabilities.
Main Methods:
- Employed betweenness centrality to quantify structural vulnerability of the OHT network.
- Modified the Brandes algorithm to incorporate node-port characteristics without increasing computation time.
- Integrated parallelization into the modified algorithm to further reduce computation time.
- Developed an end-to-end web-based visualization system for calculating and displaying centrality results.
Main Results:
- Developed a novel betweenness centrality algorithm tailored for OHT networks with node-port structures.
- Created a functional web-based visualization system for identifying vulnerable links.
- Validated the algorithm's effectiveness by comparing results with historically identified vulnerable links from industry partners.
- Demonstrated that the node-port structure betweenness centrality accurately identifies critical network choke points.
Conclusions:
- The modified betweenness centrality algorithm effectively identifies vulnerable links in semiconductor FAB OHT networks.
- The visualization system significantly enhances the practical applicability and relevance of identifying network vulnerabilities.
- Optimizing OHT network structure based on identified vulnerabilities can improve FAB productivity and reduce deadlocks.
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