A comprehensive review on application of atomic force microscopy in Forensic science

Area of Science:

• Forensic Science
• Materials Science
• Nanotechnology

Background:

• Microscopy is vital in forensic investigations for evidence analysis.
• Scanning probe microscopy, particularly Atomic Force Microscopy (AFM), is increasingly utilized.
• AFM offers unique capabilities for examining trace evidence.

Purpose of the Study:

• To explore the applications of Atomic Force Microscopy (AFM) in forensic science.
• To highlight AFM's role in nanomechanical forensics and nanoscale characterization.
• To demonstrate AFM as a valuable tool for evidence analysis.

Main Methods:

• Utilizing Atomic Force Microscopy (AFM) for evidence examination.
• Employing AFM for nanomechanical and nanoscale characterization.
• Performing non-destructive analysis of forensic samples in various environments.

Main Results:

• AFM provides detailed morphological and physico-chemical information.
• The technique is effective for analyzing diverse forensically significant samples.
• Non-destructive analysis is achievable without complex sample preparation.

Conclusions:

• Atomic Force Microscopy (AFM) is a powerful, non-destructive tool for forensic investigations.
• AFM enhances the analysis of evidence at the nanoscale.
• Its application in nanomechanical forensics and nanoscale characterization is significant.