Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Three-Dimensional Analysis of Strain01:29

Three-Dimensional Analysis of Strain

Three-dimensional strain analysis is crucial for understanding how materials deform under stress, particularly in elastic, homogeneous materials. This method employs principal stress axes to simplify complex stress states into more understandable forms. Subjected to stress, a small cubic element within a material either expands or contracts along these axes, transforming into a rectangular parallelepiped. This transformation effectively illustrates the material's deformation. The principal...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Flash electropolishing for TEM: Reducing FIB-induced defects in tungsten with protocols for new materials.

Journal of microscopy·2026
Same author

Scanning Transmission Electron Microscopy-Atom Probe Tomography Correlative Analysis for the Characterization of Solute-defect Interactions.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2025
Same author

Cost-Effective Thermomechanical Processing of Nanostructured Ferritic Alloys: Microstructure and Mechanical Properties Investigation.

Materials (Basel, Switzerland)·2024
Same author

Ionomer-free and recyclable porous-transport electrode for high-performing proton-exchange-membrane water electrolysis.

Nature communications·2023
Same author

Data on Cu- and Ni-Si-Mn-rich solute clustering in a neutron irradiated austenitic stainless steel.

Data in brief·2022
Same author

Mechanism of FIB-Induced Phase Transformation in Austenitic Steel.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2021

Related Experiment Video

Updated: May 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.8K

Application of Weak-Beam Dark-Field STEM for Dislocation Loop Analysis†.

Yan-Ru Lin1, Yao Li2,3, Steven J Zinkle1,2

  • 1Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|July 15, 2024
PubMed
Summary
This summary is machine-generated.

Weak-beam dark-field scanning transmission electron microscopy (STEM) offers superior imaging of irradiation-induced dislocation loops in materials. This advanced technique provides clearer, more detailed defect analysis than traditional methods for nuclear applications.

Keywords:
STEMTEMdislocationdislocation loopsirradiation-induced defectsweak-beam dark-field

More Related Videos

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
08:31

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Published on: June 27, 2022

1.7K
Visualization of Organelles In Situ by Cryo-STEM Tomography
08:37

Visualization of Organelles In Situ by Cryo-STEM Tomography

Published on: June 23, 2023

2.0K

Related Experiment Videos

Last Updated: May 7, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.8K
Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
08:31

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments

Published on: June 27, 2022

1.7K
Visualization of Organelles In Situ by Cryo-STEM Tomography
08:37

Visualization of Organelles In Situ by Cryo-STEM Tomography

Published on: June 23, 2023

2.0K

Area of Science:

  • Materials Science
  • Nuclear Engineering
  • Microscopy

Background:

  • Irradiation-induced nanoscale dislocation loops significantly impact material properties, causing hardening and embrittlement in nuclear reactor environments.
  • Traditional transmission electron microscopy (TEM) is the standard for dislocation imaging, but advancements in scanning transmission electron microscopy (STEM) offer new possibilities.

Purpose of the Study:

  • To explore and evaluate weak-beam dark-field (WBDF) STEM methods for quantitative analysis of irradiation-induced defects, specifically dislocation loops.
  • To compare the effectiveness of WBDF STEM techniques against traditional TEM for defect imaging and characterization.

Main Methods:

  • Utilized high-purity Fe-5 wt% Cr model alloy irradiated with 8 MeV Fe2+ ions at 450°C.
  • Applied and compared three distinct WBDF STEM imaging modes.
  • Analyzed the suppression of background noise, isolation of defect information, and identification of loop characteristics (type, nature).

Main Results:

  • WBDF STEM methods effectively suppressed background contrasts, enabling clearer visualization of dislocation loops.
  • Techniques allowed for precise classification of dislocation loop types and detailed imaging of small loops.
  • Inside-outside contrast provided reliable identification of loop nature, surpassing traditional TEM capabilities.

Conclusions:

  • WBDF STEM techniques provide superior resolution and detail for dislocation loop analysis compared to conventional TEM.
  • These advanced STEM methods are highly adaptable for defect analysis across diverse material systems, extending beyond nuclear applications.